1. Electromigration and electronic device degradation
Author: / edited by Aris Christou
Library: Library of Campus2 Colleges of Engineering of Tehran University (Tehran)
Subject: Integrated circuits - Deterioration,Semiconductors - Failures,Electrodiffusion
Classification :
TK
7874
.
E477
1994
2. Reliability of gallium arsenide MMICs
Author: / edited by Aris Christou
Library: Library of Campus2 Colleges of Engineering of Tehran University (Tehran)
Subject: Microwave integrated circuits - Reliability,Microwave integrated circuits - Testing,Gallium arsenide semiconductors - Reliability,Gallium arsenide semiconductors - Testing
Classification :
TK
7876
.
R445
1992
3. Reliability of gallium arsenide MMICs
Author: edited by Aris Christou
Library: Central Library of Amirkabir University of Technology (Tehran)
Subject: Microwave integrated circuits - Reliability , Microwave integrated circuits - Testing , Gallium arsenide semiconductors - Reliability , Gallium arsenide semiconductors - Testing
Classification :
TK
7876
.
R445
4. Reliability of gallium arsenide mmics
Author: edited by: Aris christou
Library: (Semnan)
Subject: ، Microwave integrated circuits- Reliability,، Microwave integrated circuits- Testing,، Gallium aresenide semiconductors- Reliability
Classification :
TK
7876
.
R4
